CT8201 LD chip compatible normal temperature and high temperature die tester
One unit compatible with LIV·EA·spectrum — fully automatic, ultra-high efficiency tester, essential for mass production.
The Semight RT & HT Daitester CT8201 is a high-performance automatic test system capable of performing LIV scans, EA scans, and spectral scans for DFB lasers and EML (Electro-absorption Modulated Laser) devices at both room temperature and high temperature in two temperature ranges. ■ Main Supported Tests and Functions - Forward and reverse optical measurements (photocurrent/IV measurements) - Forward spectral measurements (emission spectrum) - Simultaneous support for two temperature zones (parallel measurement of room temperature and high temperature on two independent platforms) - Equipped with high-precision thermal control and stable supply probe structure ■ Productivity, Accuracy, and Stability The CT8201 can complete all six processes (loading, transport, recognition, measurement, classification) in just 6 seconds. Particularly in EML measurements, further throughput optimization is possible depending on the measurement item configuration. Additionally, it incorporates an eccentric cam structure, high-precision linear motors, high reproducibility stepping control, high thermal conductivity chuck, and high rigidity probe structure, achieving ultra-high precision and ultra-high stability, making it ideal for die sorting and reliability testing in mass production.
- 企業：Semi Next 本社、三重事業所
- 価格：Other
